Zewnętrzne identyfikatory
| WoS ResearcherID | BRAK |
| ORCID | BRAK |
| Scopus ID | BRAK |
Historia zatrudnienia
| Belarusian State Pedagogical University Minsk | zatrudniony do dnia dzisiejszego |
Trzy ostatnio wprowadzone artykuły autora (2)
Analysis of the composition of Ti-based thin films deposited on silicon by means of self-ion assisted deposition / I. S. Tashlykov, P. V. Zukowski, S. M. Baraishuk, O. M. Mikhalkovich // Radiation Effects and Defects in Solids : Incorporating Plasma Science and Plasma Technology.- 2007, vol. 162, nr 9, s. 637-641
Surface properties of Me/Si structures prepared by means of self-ion assisted deposition / Igor Tashlykov, Paweł Żukowski, Oleg M. Mikhalkovich, Sergei M. Baraishuk // Acta Physica Polonica A.- 2014, vol. 125, nr 6, s. 1306-1308 [MNiSW: 15]
Trzy ostatnio wprowadzone fragmenty książek autora (1)
Surface properties of Me/Si structures prepared by means of self-ion assisted deposition / Igor Tashlykov, Paweł Żukowski, Sergei M. Baraishuk, Oleg M. Mikhalkovich. [W]: 8th International Conference "New Electrical and Electronic Technologies and their Industrial Implementation"NEET 2013, Zakopane, Poland, June 18-21, 2013 :[book of abstrcts].- 2013, s. 73-73
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