Impedance of (CoFeZr)0,559(PbZrTiO3)0,441 nanocomposite annealed in a tubular furnace
Fragment książki (Materiały konferencyjne)
MNiSW
15
WOS
Status: | |
Autorzy: | Boiko Oleksandr |
Wersja dokumentu: | Drukowana | Elektroniczna |
Arkusze wydawnicze: | 0.5 |
Język: | angielski |
Web of Science® Times Cited: | 0 |
Scopus® Cytowania: | 0 |
Bazy: | Web of Science | Scopus | Web of Science Core Collectio | EBSCO | INSPEC | SPIE Digital Library |
Efekt badań statutowych | NIE |
Materiał konferencyjny: | TAK |
Nazwa konferencji: | 8th International Conference on Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies (ATOM-N) |
Termin konferencji: | 25 sierpnia 2016 do 28 sierpnia 2016 |
Miasto konferencji: | Constanta |
Państwo konferencji: | RUMUNIA |
Publikacja OA: | NIE |
Abstrakty: | angielski |
The objective of the present research has been to determine the influence of annealing in tubular furnace on capacity of (CoFeZr)0,559(PbZrTiO3)0,441 nanocomposite produced by ion beam sputtering using combined argon and oxygen beam. The phase angle of the nanocomposite directly after preparing demonstrates negative values, which indicates the capacitive type of electrical conductivity of the material. The rapid increase of conductivity when frequency increases indicates hopping conductance in the material. The additional polarization of the nanocomposite occurs with its extinction in the area of high frequencies. The electrons relaxation time has been defined as of ca τ = 1,25×10-4 s. Annealing of nanocomposite sample x = 55.9 at.% at temperature Ta = 548 K causes phase angle obtains positive values in high frequency area, which indicates the change of conduction type from capacitive to inductive. The voltage resonance phenomenon occurs in the material. Annealing in temperature of Ta = 648 K causes changes of the nanomaterials capacity. The additional oxidization of CoFeZr metallic phase nanograins which provides to the potential barrier formation around potential wells (CoFeZr nanoparticles). © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. |