Correction of dynamic characteristics of temperature measuring devices
Fragment książki (Materiały konferencyjne)
MNiSW
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| Status: | |
| Autorzy: | Boyko Oksana, Hotra Oleksandra |
| Dyscypliny: | |
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| Wersja dokumentu: | Drukowana | Elektroniczna |
| Arkusze wydawnicze: | 0,5 |
| Język: | angielski |
| Strony: | 1561 - 1567 |
| Web of Science® Times Cited: | 1 |
| Scopus® Cytowania: | 2 |
| Bazy: | Web of Science | Scopus |
| Efekt badań statutowych | NIE |
| Materiał konferencyjny: | TAK |
| Nazwa konferencji: | The Summer XLII-nd IEEE-SPIE Joint Symposium on Photonics, Web Engineering, Electronics for Astronomy and HIgh Energy Physic Experiments |
| Skrócona nazwa konferencji: | XLII SPIE-IEEE-PSP 2018 |
| URL serii konferencji: | LINK |
| Termin konferencji: | 3 czerwca 2018 do 10 czerwca 2018 |
| Miasto konferencji: | Wilga |
| Państwo konferencji: | POLSKA |
| Publikacja OA: | NIE |
| Abstrakty: | angielski |
| The correction method of dynamic characteristics of temperature measuring devices is proposed. It is based on the measurement of the RTD's resistance value at a certain moment of the beginning of the transition process with subsequent calculation (by developed algorithm) of the given RTD's resistance value corresponding to the measured temperature value. The structural scheme of the thermoresistive converter with the RTD pre-heating to the initial temperature value of the measuring range and with microprocessor calculation of the measured temperature value has been developed. The accuracy of temperature determination in this case is mainly determined by the accuracy of temperature measurement at a time instant t of the transition process beginning chosen less than the time constant of the RTD t <tau. It has been found that the proposed temperature measuring device provides the measurement accuracy of 0.05 degrees C at the measurement time t=0. 1 tau. |
