An approach in determining the critical level of degradation based on results of accelerated test
Artykuł w czasopiśmie
MNiSW
140
Lista 2021
| Status: | |
| Autorzy: | Hoang Anh D., Vintr Zdeněk, Vališ David, Mazurkiewicz Dariusz |
| Dyscypliny: | |
| Aby zobaczyć szczegóły należy się zalogować. | |
| Rok wydania: | 2022 |
| Wersja dokumentu: | Drukowana | Elektroniczna |
| Język: | angielski |
| Numer czasopisma: | 2 |
| Wolumen/Tom: | 24 |
| Strony: | 330 - 337 |
| Impact Factor: | 2,5 |
| Web of Science® Times Cited: | 1 |
| Scopus® Cytowania: | 5 |
| Bazy: | Web of Science | Scopus |
| Efekt badań statutowych | NIE |
| Finansowanie: | This article has been prepared with the support of the Ministry of Defence of the Czech Republic – Project for the Development of the Organization „DZRO Military autonomous and robotic systems“ and Specific Research Project “SV22-202 Development andresearch of technologies for evaluating the properties of military ground vehicles”. Research co-financed by the Scientific Discipline of Mechanical Engineering (Lublin University of Technology, grant nr FD-20/IM-5/072). |
| Materiał konferencyjny: | NIE |
| Publikacja OA: | TAK |
| Licencja: | |
| Sposób udostępnienia: | Otwarte czasopismo |
| Wersja tekstu: | Ostateczna wersja opublikowana |
| Czas opublikowania: | W momencie opublikowania |
| Data opublikowania w OA: | 19 kwietnia 2022 |
| Abstrakty: | angielski |
| Nowadays, systems are more complex and require high reliability for their components, especially critical system components. Therefore, to avoid serious damage, system are often replaced before the actual failure. The replaced parts are considered to have “soft failure”, and the limit in which the parts are replaced is known as the critical level of the degradation process. Determining the appropriate value of the critical level for a product is an important problem in their exploitation, as well as for predicting the Mean Time to Failure (MTTF) or Remaining Useful Lifetime (RUL) of this product based on the degradation data by the mathematical models. In this article, an approach in determining the critical levels based on failure data from an accelerated test is introduced. This approach is applied with the degra- dation process of Light-Emitting Diodes (LED) in an accelerated test and a type of Wiener process-based model is used to predict the MTTF or RUL of LED based on their degradation data and the found critical level. |
