Influence of Annealing on the Dielectric Properties of Zn-SiO2/Si Nanocomposites Obtained in “Hot” Implantation Conditions
Artykuł w czasopiśmie
MNiSW
100
Lista 2021
Status: | |
Autorzy: | Kołtunowicz Tomasz, Czarnacka Karolina, Gałaszkiewicz Piotr, Komarov Fadei F., Makhavikou Maksim, Milchanin Oleg |
Dyscypliny: | |
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Rok wydania: | 2022 |
Wersja dokumentu: | Drukowana | Elektroniczna |
Język: | angielski |
Numer czasopisma: | 19 |
Wolumen/Tom: | 12 |
Numer artykułu: | 3449 |
Strony: | 1 - 15 |
Impact Factor: | 5,3 |
Web of Science® Times Cited: | 0 |
Scopus® Cytowania: | 0 |
Bazy: | Web of Science | Scopus |
Efekt badań statutowych | NIE |
Finansowanie: | This research was supported by a subsidy from the Ministry of Education and Science (Poland) for the Lublin University of Technology as funds allocated for activities in the scientific disciplines of automation, electronics and electrical engineering (grant FD-20/EE-2/703). |
Materiał konferencyjny: | NIE |
Publikacja OA: | TAK |
Licencja: | |
Sposób udostępnienia: | Witryna wydawcy |
Wersja tekstu: | Ostateczna wersja opublikowana |
Czas opublikowania: | Przed opublikowaniem |
Data opublikowania w OA: | 2 października 2022 |
Abstrakty: | angielski |
This paper presents the results of AC electrical measurements of Zn-SiO2/Si nanocompos- ites obtained by ion implantation. Implantation of Zn ions was carried out into thermally oxidized p-type silicon substrates with energy of 150 keV and fluence of 7.5 × 1016 ion·cm−2 at a temperature of 773 K, and is thus called implantation in “hot” conditions. The samples were annealed in ambient air for 60 min at 973 K. Electrical measurements of Zn-SiO2/Si nanocomposites were carried out before and after annealing. Measurements were performed in the temperature range from 20 K to 375 K. The measurement parameters were the resistance Rp, the capacitance Cp, the phase shift angle θ and the tangent of loss angle tanδ, as a function of the frequency in the range from 50 Hz to 5 MHz. Based on the characteristics σ(f ) and the Jonscher power law before and after sample annealing, the values of the exponent s were calculated depending on the measurement temperature. Based on this, the conductivity models were matched. Additionally, the real and imaginary parts of the dielectric permittivity were determined, and on their basis, the polarization mechanisms in the tested material were also determined. |