Concept of Using Cloud to Improve Accuracy and Metrological Reliability of IoT Based Data Acquisition Systems
Fragment książki (Rozdział monografii pokonferencyjnej)
MNiSW
5
spoza wykazu
| Status: | |
| Autorzy: | Maslyiak Bogdan, Beshley Mykola, Vozna Nataliia, Segin Andriy , Kochan Roman, Caban Jacek, Beshley Halyna, Yeromenko Valerii, Kobylianskyi Roman |
| Dyscypliny: | |
| Aby zobaczyć szczegóły należy się zalogować. | |
| Wersja dokumentu: | Drukowana | Elektroniczna |
| Język: | angielski |
| Strony: | 229 - 232 |
| Scopus® Cytowania: | 0 |
| Bazy: | Scopus |
| Efekt badań statutowych | NIE |
| Materiał konferencyjny: | TAK |
| Nazwa konferencji: | 15th International Conference on Measurement |
| Skrócona nazwa konferencji: | MEASUREMENT 2025 |
| URL serii konferencji: | LINK |
| Termin konferencji: | 2 czerwca 2025 do 4 czerwca 2025 |
| Miasto konferencji: | Smolenice Castle |
| Państwo konferencji: | SŁOWACJA |
| Publikacja OA: | NIE |
| Abstrakty: | angielski |
| This paper presents a conceptual system for collecting and storing measurement data in Cloud to enhance the metrological characteristics of IoT sensors. The influence of operating conditions on signal drift and measurement accuracy is analyzed, and an adaptive method for determining the intercalibration period (ICP) is developed. A predictive algorithm for changes in metrological characteristics is proposed based on historical data, statistical methods, and machine learning techniques. The system utilizes cloud technologies for centralized data analysis and adaptive calibration interval adjustment, reducing sensor maintenance costs and improving measurement accuracy. It is demonstrated that predictive modeling enables the extension of the intercalibration period without compromising accuracy. The findings are particularly relevant for decentralized IoT systems where physical calibration is challenging or costly. The use of cloud platforms for data collection and analysis allows real-time detection of deviations and measurement error correction, contributing to improved efficiency and reliability of measurement systems. |
