Test station for frequency-domain dielectric spectroscopy of nanocomposites and semiconductors
Artykuł w czasopiśmie
MNiSW
15
Lista A
| Status: | |
| Autorzy: | Kołtunowicz Tomasz |
| Rok wydania: | 2015 |
| Wersja dokumentu: | Drukowana | Elektroniczna |
| Język: | angielski |
| Numer czasopisma: | 4 |
| Wolumen/Tom: | 82 |
| Strony: | 653 - 658 |
| Impact Factor: | 0,51 |
| Web of Science® Times Cited: | 39 |
| Scopus® Cytowania: | 43 |
| Bazy: | Web of Science | Scopus | WOS |
| Efekt badań statutowych | NIE |
| Materiał konferencyjny: | NIE |
| Publikacja OA: | NIE |
| Abstrakty: | angielski |
| An upgraded test station is described for determining the electrophysical properties of materials by frequencydomain dielectric spectroscopy. As result of the upgrade, the range of measurable temperatures is expanded ( the fuul range of measurable temperatures is 10-450 K ) and also better accuracy of the measurement and temperature control is achieved. The test station is controlled using a new special computer program. The upgraded test station makes it possible to simultaneously study two samples in the a.c. frequency range from 50 Hz to 5 MHz. Results of studies of the electrical properties (resistance Rp capacitance Cp phase shift ange 0, and dielectric loss tangent or dissipation factor tan ) asrte presented for the metal-dielectric nanocomposite (FeCoZr)x(CaF2) (100-x) |
