Surface composition of CIS compound affected by Xe + Irradiation
Artykuł w czasopiśmie
MNiSW
15
Lista A
| Status: | |
| Autorzy: | Tashlykov Igor S., Żukowski Paweł, Silvanovich D.A., Gremenok Valery F. |
| Rok wydania: | 2015 |
| Wersja dokumentu: | Drukowana | Elektroniczna |
| Język: | angielski |
| Numer czasopisma: | 5 |
| Wolumen/Tom: | 128 |
| Strony: | 927 - 930 |
| Impact Factor: | 0,525 |
| Web of Science® Times Cited: | 0 |
| Scopus® Cytowania: | 0 |
| Bazy: | Web of Science | Scopus | Web of Science Core Collection |
| Efekt badań statutowych | NIE |
| Materiał konferencyjny: | NIE |
| Publikacja OA: | NIE |
| Abstrakty: | angielski |
| The paper presents the results of investigation of element composition of CuInSe2 (CIS) compounds obtainedby vertical Bridgman technique and on a glass substrate by the thermal deposition of Cu–In thin films with the subsequent annealing in selenium vapour. The depth profile distribution of elements in these samples using the Rutherford backscattering spectrometry/channeling technique in conjunction with the RUMP code simulation isalso discussed |
