Baza Publikacji Pracowników Politechniki Lubelskiej

Status:
Warianty tytułu:	Структура і елементний склад плівок Pb 1 – x Sn x S
Autorzy:	Koval P.V., Оpanasyuk А.S. , Turavets Anton I., Tashlykov Igor S., Ponomarev A. A., Żukowski Paweł
Rok wydania:	2015
Wersja dokumentu:	Drukowana \| Elektroniczna
Arkusze wydawnicze:	0,5
Język:	angielski
Numer czasopisma:	2
Wolumen/Tom:	7
Strony:	1 - 7
Bazy:	EBSCO \| DOAJ
Efekt badań statutowych	NIE
Materiał konferencyjny:	NIE
Publikacja OA:	TAK
Licencja:
Sposób udostępnienia:	Witryna wydawcy
Wersja tekstu:	Ostateczna wersja opublikowana
Czas opublikowania:	W momencie opublikowania
Abstrakty:	angielski
	In this paper by the methods of diffractometry, scanning and atomic force microscopy, X-ray characteristic radiation induced by focused proton beam (PIXE), Rutherford backscattering of helium-4 ions we have investigated Pb1 – xSnxS films obtained by "hot wall". It was found that layers obtained by condensation in the temperature range of Ts = (268-382) °C have virtually a single phase orthorhombic crystal structure with lattice parameters which vary in the range of a = (0.4214-0.4293) nm, b = (1.1246-1.1313) nm, c = (0.3980-0.4015) nm. CSD sizes in the films are equal to L(040) = (35.5-47.5) nm, L(131) = (44.4-51.5) nm. The distribution of the components of a compound of films (μ-PIXE) and their elemental composition (PIXE) are determined. It was found that some samples were depleted by sulfur in comparison with the stoichiometric composition. Atomic concentration of the components of the solid solution varies in the range of СPb = 12.71-19.13; CSn = 40.29-44.46; CS = 38.36-42.75 at. %. By increasing the substrate temperature, the lead content in the films increases and the sulfur content decreases, the atomic concentration of tin in this case varies slightly

Informacja o cookies

Structure and elemental composition of Pb1 – xSnxS films

Artykuł w czasopiśmie