Baza Publikacji Pracowników Politechniki Lubelskiej

Status:
Autorzy:	Węgierek Paweł, Billewicz Piotr
Rok wydania:	2015
Wersja dokumentu:	Drukowana \| Elektroniczna
Język:	angielski
Numer czasopisma:	5
Wolumen/Tom:	128
Strony:	943 - 945
Impact Factor:	0,525
Web of Science® Times Cited:	4
Scopus® Cytowania:	5
Bazy:	Web of Science \| Scopus \| Web of Science Core Collection
Efekt badań statutowych	NIE
Materiał konferencyjny:	NIE
Publikacja OA:	TAK
Licencja:
Sposób udostępnienia:	Witryna wydawcy
Wersja tekstu:	Ostateczna wersja opublikowana
Czas opublikowania:	W momencie opublikowania
Abstrakty:	angielski
	Considering the results of recent research, it is possible to state that the problem of thermal stability of electrical parameters of silicon is very important in the context of efficiency of commonly used photovoltaic cells. Subsequent investigations confirmed that the efficiency of photovoltaic cells is strongly influenced by active defects of silicon crystal lattice. Those defects, arising in the process of photovoltaic cells base material preparation, are responsible for changes in the values of conductivity and activation energy of the tested material. Taking this into consideration, it is reasonable to carry out research oriented at experimental verification of the influence of both operating temperature on the electrical parameters of silicon and annealing temperature on the distribution of radiation defects in the silicon substrate used in the production of photovoltaic cells. The main purpose of this work is a comparative analysis of dependences of electrical parameters of silicon on temperature. The article presents the results of the research on resistivity and capacity of silicon samples (doped with boron and phosphorus) whose structure was modified by the ion implantation process.

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Research on thermal stability of electrical parameters of silicon used in PV cells production process

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