Carbonization in boron-ion-implanted polymethylmethacrylate as revealed from Raman spectroscopy and electrical measurements
Artykuł w czasopiśmie
MNiSW
15
Lista A
| Status: | |
| Autorzy: | Kavetskyy Taras, Nowak Jakub, Borc Jarosław, Rusnák Jaroslav, Šauša Ondrej, Stepanov Andrey L. |
| Rok wydania: | 2016 |
| Wersja dokumentu: | Drukowana | Elektroniczna |
| Język: | angielski |
| Numer czasopisma: | 1 |
| Wolumen/Tom: | 49 |
| Strony: | 5 - 10 |
| Impact Factor: | 0,794 |
| Web of Science® Times Cited: | 11 |
| Scopus® Cytowania: | 11 |
| Bazy: | Web of Science | Scopus |
| Efekt badań statutowych | NIE |
| Materiał konferencyjny: | NIE |
| Publikacja OA: | NIE |
| Abstrakty: | angielski |
| The results of Raman spectroscopy and electrical measurements of 40 keV boron-ion-implanted polymethylmethacrylate with ion doses from 6.25 × 1014 to 5.0 × 1016 ions/cm2 are reported for the first time. The Raman spectra recorded in the 400–3800 cm−1 range, showing the formation of new carbon–carbon bands for the as-implanted samples at higher ion doses (>1016 ions/cm2), are found to be an additional support for carbonization processes earlier revealed by slow positrons. The current–voltage dependences at 360 K testify also that the as-implanted samples examined with higher fluences (3.75 × 1016 and 5.0 × 1016 ions/cm2) have created a very thin conductive layer or conductive joints due to carbonization |
