Influence of design and annealing parameters on measurements of AC properties of NiFe-SiO2 multilayer structures
Artykuł w czasopiśmie
MNiSW
100
Lista 2024
Status: | |
Autorzy: | Wilczyńska Aleksandra, Kołtunowicz Tomasz, Kociubiński Andrzej, Guzowski Bartłomiej, Łakomski Mateusz |
Dyscypliny: | |
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Rok wydania: | 2024 |
Wersja dokumentu: | Drukowana | Elektroniczna |
Język: | angielski |
Wolumen/Tom: | 597 |
Strony: | 1 - 16 |
Impact Factor: | 2,5 |
Web of Science® Times Cited: | 0 |
Scopus® Cytowania: | 0 |
Bazy: | Web of Science | Scopus |
Efekt badań statutowych | NIE |
Materiał konferencyjny: | NIE |
Publikacja OA: | TAK |
Licencja: | |
Sposób udostępnienia: | Witryna wydawcy |
Wersja tekstu: | Ostateczna wersja opublikowana |
Czas opublikowania: | W momencie opublikowania |
Abstrakty: | angielski |
In this article, due to the exceptionally interesting electrical and magnetic properties of nanocomposites, which include ferromagnetic materials in a dielectric matrix, multilayer NiFe-SiO2 nanocomposites were obtained. The entire sequence of technological processes using magnetron sputtering equipment in the presence of argon was presented, the aim of which was to create structures with different numbers and thicknesses of layers, as well as in two measurement configurations. Measurements of AC electrical properties were carried out in a variable temperature range, i.e. from room temperature to 373 K, using the 4-point method. The obtained measurement results were compared in terms of design parameters, such as thickness and number of layers, as well as technological parameters, such as heating duration. Structural analysis was performed using scanning electron microscopy (SEM) to investigate the effect of oxidation on the multilayer structures and to confirm the granular structure of the nanocomposite. Additionally, the chemical composition of the obtained multilayers was examined using Energy-dispersive X-ray spectroscopy (EDX). Resistive parameters were tested in the range of magnetic field induction from 0 T to 0.3 T. Based on the conductivity relationships, it was proven that a hopping mechanism of current conduction occurs in the tested samples. Using the frequency dependencies of the phase shift angle, it is possible to adjust the equivalent RC electronic circuit, thereby determining the potential application of the tested materials. |